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PIKE Technologies FTIR, NIR and UV-Vis accessories and supplies
PIKE Technologies is a unique enterprise specializing in the imaginative design and creation of excellent spectroscopic accessories, providing high-quality solutions to all customers.

You can download the whole PIKE Technologies 2017 catalog or individual chapters of interest.

PIKE Technologies standards, software and databases for spectroscopy
If you have not found the ideal sampling tool, please contact Norlab. Your spectroscopy sampling requirements may become one of PIKE Technologies product offerings in the future.

PIKE Technologies UV-Vis accessories
PIKE Technologies is addressing the growing need for more sophisticated UV-Vis accessories by featuring research-style specular reflectance accessories, polarizers and automated sampling stages.

PIKE Technologies FTIR accessories for special applications
Accessories specially designed for use in a dedicated sampling environment.

PIKE Technologies transmission sampling accessories for FTIR spectrometers
Transmission sampling is a popular method for the collection of infrared spectra for qualitative or quantitative analysis.

PIKE Technologies microsampling accessories for FTIR spectrometers
For samples considerably smaller than a typical 8–10 mm IR beam, microsampling accessories and microhandling tools make ideal additions to your FTIR spectrometer.

PIKE Technologies remote sampling accessories for FTIR spectrometers
Hollow waveguide and fiber optic sampling accessories provide a new dimension of flexibility – expanding the reach of the sample compartment.

 

PIKE Technologies integrating spheres
Integrating spheres are useful for qualitative and quantitative measurements of sample composition when morphology, particle size, surface roughness or sample flatness varies from sample to sample.

PIKE Technologies polarizers for FTIR spectrometers
Polarizers may be used to detect oriented samples and for measurement of thin films on reflective substrates.

PIKE Technologies specular reflectance sampling accessories for FTIR
Specular reflectance sampling represents a very important technique useful for the measurement of thin films on reflective substrates, the analysis of bulk materials and the measurement of mono-molecular layers on a substrate material.

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